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Wednesday, July 22, 2020 | History

4 edition of 2000 IEEE International Workshop on Defect Based Testing found in the catalog.

2000 IEEE International Workshop on Defect Based Testing

April 30, 2000, Montreal, Canada : proceedings

by IEEE International Workshop on Defect Based Testing (2000 MontreМЃal, QueМЃbec)

  • 115 Want to read
  • 21 Currently reading

Published by IEEE Computer Society in Los Alamitos, Calif .
Written in English

    Subjects:
  • Integrated circuits -- Defects -- Congresses.,
  • Iddq testing -- Congresses.,
  • Metal oxide semiconductors, Complementary -- Congresses.

  • Edition Notes

    Other titlesDigest of papers, IEEE International Workshop on Defect Based Testing, DBT 2000
    Statementsponsored by IEEE Computer Society Test Technology Technical Committee ; edited by Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon.
    GenreCongresses.
    ContributionsMalaiya, Yashwant K., Sachdev, Manoj., Menon, Sankaran M., IEEE Computer Society. Test Technology Technical Committee., IEEE VLSI Test Symposium (2000 : Montréal, Québec)
    Classifications
    LC ClassificationsTK7874 .I326 2000
    The Physical Object
    Paginationix, 82 p. :
    Number of Pages82
    ID Numbers
    Open LibraryOL6798331M
    ISBN 100769506372
    LC Control Number00102862

    Testing of Deep-Submicron Battery-Operated Circuits using New Fast Current Monitoring Scheme - IEEE International Workshop on Defect Based Testing, April Fast Current Monitoring Technique for Low-Voltage VLSI Testing - IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECSÕ), April He served as Program Chair of the IEEE Defect-Based Testing (DBT) workshop, Program Chair of the IEEE Defect and Data Driven Testing (D3T) workshop, Co-program Chair of the International Symposium on Defect and Fault Tolerance in VLSI Systems (DFTS), General Chair for D3T and DFTS, and Vice-general Chair for NATW

    DBT IEEE International Workshop on Current & Defect Based Testing: proceedings: Ap , Napa Valley Marriott, Napa Valley, CA, USA. Editorial Full text access Advancing test automation technology to meet the challenges of model-based software testing – Guest editors’ introduction to the special section of the Third IEEE International Workshop on Automation of Software Test (AST ).

    The ART Workshop offers a forum to present and discuss these challenges and emerging solutions among researchers and practitioners alike. ART will take place in conjunction with the IEEE International Test Conference (ITC) and is sponsored by the Test Technology Technical Council (TTTC) of IEEE Computer Society. In: Proceedings of the IEEE International Conference on Software Testing Verification and Validation Workshop (ICSTW'08). IEEE Computer Society, Washington, DC, .


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2000 IEEE International Workshop on Defect Based Testing by IEEE International Workshop on Defect Based Testing (2000 MontreМЃal, QueМЃbec) Download PDF EPUB FB2

Get this from a library. IEEE International Workshop on Defect Based Testing: ApMontreal, Canada: proceedings. [Yashwant K Malaiya; Manoj Sachdev; Sankaran M Menon; IEEE Computer Society. Test Technology Technical Committee.;]. Defect and Fault Tolerance in Vlsi Systems (Dft ): IEEE International Symposium [IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems] on *FREE* shipping on qualifying offers.

This volume includes 45 papers presented at the October symposium, covering yield analysis, modelingAuthor: IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems. Records of the IEEE International Workshop on Memory Technology, Design and Testing Year: A low voltage embedded single port SRAM generator in a /spl mu/m standard CMOS process.

The results demonstrate various trade-offs that can be explored using the framework, and that lower test escape (for zero yield loss) and lower yield loss (for zero test escape) can be obtained compared to known techniques. Published in: Proceedings IEEE International Workshop on Defect Based Testing (Cat.

)Author: Hugo Cheung, S.K. Gupta. Optimal clustering and statistical identification of defective ICs using I/spl DDQ/ testing - Defect Based Testing, Proceedings. IEEE International Workshop on Author: IEEE Created Date: 6/1/ PM.

IEEE International Defect Based Testing Workshop –DBT’ October 26th – 27th, Santa Clara Convention Center, California (Preliminary Version 1) Day 1 – October 26th. pm – Opening Remarks – M. Tahoori (Northeastern Univ.), J.

Plusquellic (UMBC) pm – pm. Thursday Keynote: The Changing Role of Test. Phil Nigh (IBM). International workshop on defect based testing, pp 36–42 Google Scholar Soden JM, Hawkins CF () I DDQ testing: issues present and future.

IEEE Des Test Comput –65 CrossRef Google ScholarAuthor: Michel Renovell, Florence Azais, Joan Figueras, Rosa Rodríguez-Montañés, Daniel Arumí. CNNA Proceedings., Fourth IEEE International Workshop on; Cellular Neural Networks and Their Applications, (CNNA ). Proceedings of the 6th IEEE International Workshop on; Cellular Neural Networks and Their Applications, (CNNA ).

Proceedings of the 7th IEEE International Workshop on. Outdoor ac substations, either conventional or gas-insulated, are covered in this guide. Distribution, transmission, and generating plant substations are also included.

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Annual International Conference of the IEEE Engineering in Medicine & Biology Conference (EMBC) The conference program will consist of plenary lectures, symposia, workshops and invitedsessions of the latest significant findings and developments in all the major fields of biomedical ted full papers will be peer reviewed.

Conferences related to System Level Testing Back to Top. IEEE/MTT-S International Microwave Symposium - IMS The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter-wave, terahertz, and optical.

S.B. Drummonds et al., "Bridging the Gap Between Logical Diagnosis and Physical Analysis," in IEEE International Workshop on Defect Based Testing (DBT'). Web Services promote the specification-based cooperation and collaboration among distributed applications in an open environment.

To ensure the quality of the services that are published, bound, invoked and integrated at runtime, test cases have to be automatically generated and testing executed, monitored and analyzed at runtime.

Dworak et al, “Enhanced DO-RE-ME Based Defect Level Prediction Using Defect Site Aggregation -MPG-D”, Proc. IEEE International Test Conference, pp.Google Scholar [14]Cited by: 2. In this paper we analyze use case based testing approaches on the basis of a defect taxonomy.

For this purpose, we propose a taxonomy classifying typical defects which need to be uncovered during system testing. Then, we survey current approaches to derive test cases from use cases and discuss their ability to reveal these by: 7.

Khare and H. Heineken, "Defect-Based Testing for Fabless Companies," Proc. IEEE Int'l Workshop on Defect Based Testing, IEEE Computer Society Press, Los Alamitos, Calif., Author: SegalJulie, JeeAlvin, LepejianDavid, ChuBen.

North Carolina State University, Raleigh, NC. Search about this author. Nachiappan Nagappan. Microsoft Research, Redmond, WA. Records of the IEEE International Workshop on Memory Technology, Design and Testing: August, San Jose, California Author: Rochit Rajsuman ; T Wik ; IEEE Computer Society.

Proceedings of the fifth international workshop on on Information retrievalCloud testing tools. X Bai, M Li, B Chen, WT Tsai, J Gao. Proceedings of IEEE 6th International Symposium on Service Oriented. S.

Hamdioui, G. Gaydadjiev, and A.J. van de Goor, “The State of the art and Future Trends in Testing Embedded Memories,” Proceedings of IEEE International Workshop on Memory Technology, Design and Testing,pp. Cited by: 1.IEEE International Workshop on Digital and Analog Test and Data Analysis (DATA) Septem Testing of digital logic has made significant improvements in recent years with the use of the stuck-at and delay fault models.

data mining techniques such as outlier analysis and adaptive test have helped to improve quality by.Part of the Frontiers in Electronic Testing book series (FRET, volume 27) and C. Hawkins, “Parametric failures in CMOS ICs -A defect-based analysis, ” IEEE International Test Conference (ITC), pp.October Failure Mechanisms and Testing in Nanometer Technologies.

In: Gizopoulos D. (eds) Gizopoulos / Advances in Cited by: 1.